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High-speed, voltage-controlled laser beam scanner with novel optical phenomenon using KTN crystal

15.12.2011

AMS Technologies presents new spectrometer using a combination of a KTN optical beam scanner and a wavelength dispersion element.

AMS Technologies presents new spectrometer using a combination of a KTa1-xNbxO3 (KTN) optical beam scanner and a wavelength dispersion element. This spectrometer can measure a wide optical spectrum in microsecond-order time because of the fast scan response of KTN optical beam scanner. The spectrometer will be used to measure microsecond optical pulses. The KTN scanner is expected to observe ultrafast luminous phenomena.

NTT-AT successfully assembled a KTN scanner as a compact module with a fiber pigtailing. The module is 20x30x60 mm in size. The temperature of the KTN scanner chip is controlled by TEC. The scanning angle is 10 degrees (±5 degrees) and the response speed is less than 1 micro second.

Image 1: KTN scanner module (space coupling) Size:W23mm×L50mm×H23mm
Image 2: KTN scanner chip Size:W3.2mm×L4mm×H1m


Key Features:

  • All solid state, opto-electric operation, no moving parts
  • Bi-direction voltage-controlled continuous and step scanning
  • 100x faster than a polygon mirror
  • 40% smaller than conventional company products
  • Wide operation wavelength in the 488-3500nm
  • Scan up to 10 degrees deflection over 100kHz


Expected Application Fields:

  • Imaging in Bio Medical Fields i.e. Microscope, Optical Coherence Tomography light source
  • Sensing in Environment Fields i.e. Gas sensor, LIDAR
  • Machining in Industrial Fields i.e. Laser marker, Laser Processing

Application Notes:

Growth Technologies and Device Applications of Electro-optic Crystal KTa1-xNbxO3

KTN Crystal Technologies