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Measurement of Passive Components

MAP Variable Backreflector

Key Features

  • Operation at 850/1310 or 1310/1550 nm
  • Single-mode or multimode fiber
  • Can be automated when used with MAP-200 LXI-compliant interfaces and IVI drivers

Description

The Multiple Application Platform (MAP) Variable Backreflector (mVBR-A1) is optimized for the industry-leading JDSU MAP-200 platform. Based on the previous-genertion MAP, the MAP-200 is the first photonic layer lab and manufacturing platform that is LAN Extensions for Instrumentation (LXI)-compliant by conforming to the required physical attributes, Ethernet connectivity, and interchangeable virtual instrument (IVI) drivers. The MAP-200 platform is optimized by density and maximum configurability to meet specific application requirements in the smallest possible foot print.

The MAP Variable Backreflector cassette provides precise levels of return loss (RL) to transmitters, enabling system sensitivity measurement or system degradation as a function of backreflection measurement. When used with a transmitter/receiver pair and characterization equipment, the MAP backreflector can be used to establish the magnitude of reflections that significantly degrade transmission system performance, and to characterize the problems they cause.

The MAP backreflector uses the JDSU linear attenuator prism and high reflectivity mirror to precisely control the level of RL. The cassette is available in single-mode (SM) or multimode (MM) fibers and with an optional coupler for monitoring.

Applications

  • Transmitter/receiver development and testing
  • Reflection testing for connectors
  • Quality assurance acceptance testing
  • Laser development and production

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