Dopant content measurement
Dopant content measurement on thin preform slices
- Detected dopants: Yb, Er, Nd, Sm, Ho, Tm
- Typical measurement duration: 15 minutes
- Preform slice thickness: 1-10 mm
- Wavelength range: 400-1700nm
DescriptionMPS is a system for measurement of absorption of light on thin preform slices, as a function of radial position, at a chosen wavelength. This method is most often used in determination of active dopant content in rare earth-doped preforms. Any other dopant causing signifi cant absorption peak can be measured as well.
MPS is available in two basic confi gurations, with monochromator or superluminiscent LED as light source. Monochromator permits measurements over wide spectrum of wavelengths, while the LED provides a cost-effective single wavelength source for measurement of a single specific rare earth dopant concentration.
The software collects measurement data and calculates dopant content from absorption, using signal baseline obtained in pure silica as reference. Software also provides data analysis and display in graphical form. Data can be exported as spreadsheet compatible file.